Analysis and evaluation of sampled imaging systems by Richard H. Vollmerhausen

By Richard H. Vollmerhausen

Advancing know-how in detector arrays, flat panel monitors, and electronic snapshot processing offers new possibilities to extend imaging functions and improve approach functionality. Technical managers and layout engineers are confronted with comparing the fee, weight, and function of an ever-expanding choice of expertise strategies. This educational textual content presents the idea, approaches, and data essential to review and evaluate the functionality of accessible imaging applied sciences. half I updates the sooner paintings awarded in Analysis of Sampled Imaging structures (2000). half II discusses functionality overview of electro-optical imagers. half III presents machine courses (on a supplemental CD-ROM) and updated info on detector arrays, optics, and demonstrate ideas.

The ebook covers various demonstrate codecs and interfaces, and offers exact details on to be had focal airplane arrays (FPAs). specific emphasis is put on thought and perform for the big variety of accessible infrared FPAs. applied sciences represented comprise InSb, HgCdTe, QWIP, and uncooled thermal arrays. details is equipped at the quantum potency, blur, crosstalk, and noise features of every expertise. The detector and array dimensions of accessible FPAs are supplied. the data on optics, exhibit, and FPA subassemblies permits the version consumer to make quickly and practical functionality checks of electro-optical imager designs

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Vollmerhausen, R. H. and T. Maurer, “Night illumination in the visible, NIR, and SWIR spectral bands,” Proc. SPIE 5076, 60–69 (2003). Waldman, G. and J. Wootton, Electro-Optical Systems Performance Modeling, Artech House, Boston (1993). org/terms Chapter 11 Computer Programs and Application Data This chapter presents an overview of the computer programs Thermal and Reflective. Both programs have help files that describe individual inputs. This chapter does the following: 1. describes the physical models and assumptions implemented in the programs, 2.

Only horizontal MTF is shown; similar formulas are used for vertical MTF. 1)  1, where  is horizontal spatial frequency in (mrad)–1, D is aperture diameter in meters,  is wavelength in meters, and Hx-diff is the horizontal diffraction MTF. 2) . 75 . 2 Imagers of reflected light This section provides suggestions for modeling objective lens MTF for reflectedlight imagers. The emphasis here and in the reflected-light computer program is on broadband passive imagers operating in the NIR and SWIR that use monochrome displays.

A third source of noise is aliasing. The aliasing-as-noise (AAN) model is described in Chapter 8. All noise sources are added in quadrature. The shot, amplifier, and dark current noise in one second and one square milliradian is given by Eq. 11) H pit V pit where Eamp = the amplifier noise in electrons per pixel per frame, EDC = dark-current electrons per pixel per frame, and TCCD = fields or frames per second. 13) give threshold vision through the imager. QHalias and QValias are defined by Eqs.

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